BIC702M
Test Circuits
• DC Biasing Circuit for Operating Characteristic Items (ID(op), |yfs|, Ciss, Coss, Crss, NF, PG)
VG2
Gate 2
VG1
Gate 1
Open
Drain
A
ID
Source
• 200 MHz Power Gain, Noise Figure Test Circuit
VT
1000p
VG2
1000p
VT
1000p
Input(50Ω)
1000p
1000p 47k
47k
L1
1000p
36p
1SV70
BICMIC
47k
L2
1000p
Output(50Ω)
10p max
RFC
1SV70
1000p
VD
L1 : φ1mm Enameled Copper Wire,Inside dia 10mm, 2Turns
L2 : φ1mm Enameled Copper Wire,Inside dia 10mm, 2Turns
RFC : φ1mm Enameled Copper Wire,Inside dia 5mm, 2Turns
Unit : Resistance (Ω)
Capacitance (F)
3