EN29F08090T Просмотр технического описания (PDF) - Eon Silicon Solution Inc.
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EN29F08090T Datasheet PDF : 37 Pages
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Table 8. AC CHARACTERISTICS
Read-only Operations Characteristics
EN29F080
Parameter
Symbols
JEDEC Standard
tAVAV
tRC
Description
Read Cycle Time
Test
Setup
Speed Options
-45 -55 -70 -90
Min 45 55 70 90
tAVQV
tELQV
tGLQV
tACC
tCE
tOE
Address to Output Delay
Chip Enable To Output Delay
CE = VIL Max 45 55 70
90
OE = VIL
OE = VIL Max 45 55 70
90
Output Enable to Output Delay
Max 25 30 30 35
tEHQZ tDF
Chip Enable to Output High Z
Max 20 20 20 20
tGHQZ tDF
Output Enable to Output High Z
Max 20 20 20 20
tAXQX tOH
Output Hold Time from
Addresses, CE or OE ,
whichever occurs first
Min
0
0
0
0
Notes:
For - 50
Vcc = 5.0V ± 5%
Output Load : 1 TTL gate and 30pF
Input Rise and Fall Times: 5ns
Input Rise Levels: 0.0 V to 3.0 V
Timing Measurement Reference Level, Input and Output: 1.5 V
For all others:
Vcc = 5.0V ± 10%
Output Load: 1 TTL gate and 100 pF
Input Rise and Fall Times: 20 ns
Input Pulse Levels: 0.45 V to 2.4 V
Timing Measurement Reference Level, Input and Output: 0.8 V and 2.0 V
Unit
ns
ns
ns
ns
ns
ns
ns
Addresses
CE#
OE#
WE#
Outputs
Reset#
RY/BY#
0V
tOEH
tRC
Addresses Stable
tACC
tDF
tOE
tCE
tOH
Output Valid
HIGH Z
Figure 5. AC Waveforms for READ Operations
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