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NLV27WZ125USG(2014) Просмотр технического описания (PDF) - ON Semiconductor

Номер в каталоге
Компоненты Описание
производитель
NLV27WZ125USG
(Rev.:2014)
ON-Semiconductor
ON Semiconductor 
NLV27WZ125USG Datasheet PDF : 5 Pages
1 2 3 4 5
NL27WZ125
MAXIMUM RATINGS
Symbol
Parameter
Value
Units
VCC
VI
VO
IIK
IOK
IO
ICC
IGND
TSTG
TL
TJ
qJA
PD
MSL
DC Supply Voltage
DC Input Voltage
DC Output Voltage
Output in High Impedance State
Output in HIGH or LOW State
DC Input Diode Current, VI < GND
DC Output Diode Current, VO < GND
DC Output Sink Current
DC Supply Current per Supply Pin
DC Ground Current per Ground Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature under Bias
Thermal Resistance (Note 1)
Power Dissipation in Still Air at 85°C
Moisture Sensitivity
0.5 to +7.0
0.5 to +7.0
0.5 to +7.0
0.5 to VCC + 0.5
50
50
±50
±100
±100
65 to +150
260
+150
250
250
Level 1
V
V
V
mA
mA
mA
mA
mA
°C
°C
°C
°C/W
mW
FR
VESD
Flammability Rating Oxygen Index: 28 to 34
ESD Withstand Voltage
Human Body Model (Note 2)
Machine Model (Note 3)
Charged Device Model (Note 4)
UL 94 V0 @ 0.125 in
V
> 2000
> 200
N/A
ILATCHUP Latchup Performance Above VCC and Below GND at 125°C (Note 5)
±100
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mmby1 inch, 2ounce copper trace with no air flow.
2. Tested to EIA/JESD22A114A.
3. Tested to EIA/JESD22A115A.
4. Tested to JESD22C101A.
5. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Units
VCC
Supply Voltage
Operating
1.65
Data Retention Only
1.5
5.5
V
5.5
VI
Input Voltage (Note 6)
0
5.5
V
VO
Output Voltage (HIGH or LOW State)
0
5.5
V
TA
Operating FreeAir Temperature
55
+125
°C
Dt/DV
Input Transition Rise or Fall Rate
VCC = 2.5 V ±0.2 V
VCC = 3.0 V ±0.3 V
VCC = 5.0 V ±0.5 V
ns/V
0
20
0
10
0
5
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
6. Unused inputs may not be left open. All inputs must be tied to a highor lowlogic input voltage level.
DEVICE ORDERING INFORMATION
Device Order Number
Package Type
Shipping
NL27WZ125USG
NLV27WZ125USG*
US8
(PbFree)
3000 / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*NLV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AECQ100 Qualified and PPAP Capable.
http://onsemi.com
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