APW1175KC-TU 查看數據表（PDF） - Anpec Electronics
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APW1175KC-TU Datasheet PDF : 10 Pages
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APW1175
Reliability test program
Test item
SOLDERABILITY
HOLT
PCT
TST
ESD
Latch-Up
Method
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B, A102
MIL-STD-883D-1011.9
MIL-STD-883D-3015.7
JESD 78
Carrier Tape
E
Po
P
P1
Description
245°C , 5 SEC
1000 Hrs Bias @ 125 °C
168 Hrs, 100 % RH , 121°C
-65°C ~ 150°C, 200 Cycles
VHBM > 2KV, VMM > 200V
10ms , IJH > 100mA
t
D
F
Bo
W
Ko
Ao
D1
T2
J
C
A
B
T1
Application
SOP- 20
A
330±1
F
B
62 ±1.5
D
C
12.75 +
0.15
D1
J
T1
T2
2 + 0.6 24.4 + 0.2 2 ± 0.2
Po
P1
Ao
11.5 ± 0.1 1.5 +0.1 1.5+ 0.25 4.0 ± 0.1 2.0 ± 0.1 8.2 ± 0.1
W
24 + 0.3
-0.1
Bo
13± 0.1
P
E
12 + 0.1 1.75± 0.1
Ko
t
2.5±
0.1
0.35±0.01
3
Copyright ANPEC Electronics Corp.
9
Rev. A.3 - July., 2003
www.anpec.com.tw
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