NXP Semiconductors
BT136-600E
4Q Triac
3
IGT
IGT (25 °C)
(1)
(2)
2
(3)
(4)
1
003aae833
(1)
(2)
(3)
(4)
3
IL
IL(25°C)
2
1
003aae835
0
−60
−10
40
90
140
Tj (°C)
(1) T2- G+
(2) T2- G-
(3) T2+ G-
(4) T2+ G+
Fig 7. Normalized gate trigger current as a function of
junction temperature
0
−60
−10
40
90
140
Tj (°C)
Fig 8. Normalized latching current as a function of
junction temperature
2.0
IH
IH(25°C)
1.5
003aae837
12
IT
(A)
8
003aae834
1.0
4
0.5
(1) (2) (3)
0
−60
−10
40
90
140
Tj (°C)
Fig 9. Normalized holding current as a function of
junction temperature
0
0
1
2
3
VT (V)
Vo = 1.27 V
Rs = 0.091 Ω
(1) Tj = 125 °C; typical values
(2) Tj = 125 °C; maximum values
(3) Tj = 25 °C; maximum values
Fig 10. On-state current as a function of on-state
voltage
BT136-600E
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 04 — 1 April 2011
© NXP B.V. 2011. All rights reserved.
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