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ISL9N306AP3 查看數據表(PDF) - Fairchild Semiconductor

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ISL9N306AP3 Datasheet PDF : 11 Pages
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Electrical Characteristics TA = 25°C unless otherwise noted
Symbol
Parameter
Test Conditions
Min
Off Characteristics
BVDSS
Drain to Source Breakdown Voltage
IDSS
Zero Gate Voltage Drain Current
IGSS
Gate to Source Leakage Current
ID = 250µA, VGS = 0V
30
VDS = 25V
-
VGS = 0V
TC = 150o
-
VGS = ±20V
-
On Characteristics
VGS(TH)
Gate to Source Threshold Voltage
VGS = VDS, ID = 250µA
1
rDS(ON)
Drain to Source On Resistance
ID = 75A, VGS = 10V
ID = 61A, VGS = 4.5V
-
-
Dynamic Characteristics
CISS
COSS
CRSS
Qg(TOT)
Qg(5)
Qg(TH)
Qgs
Qgd
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge at 10V
Total Gate Charge at 5V
Threshold Gate Charge
Gate to Source Gate Charge
Gate to Drain “Miller” Charge
-
VDS = 15V, VGS = 0V,
f = 1MHz
-
-
VGS = 0V to 10V
VGS = 0V to 5V VDD = 15V
-
VGS = 0V to 1V ID = 61A
-
Ig = 1.0mA
-
-
Switching Characteristics (VGS = 4.5V)
tON
Turn-On Time
-
td(ON)
tr
td(OFF)
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
-
VDD = 15V, ID = 18A
-
VGS = 4.5V, RGS = 4.3
-
tf
Fall Time
-
tOFF
Turn-Off Time
-
Switching Characteristics (VGS = 10V)
tON
Turn-On Time
-
td(ON)
Turn-On Delay Time
-
tr
td(OFF)
tf
Rise Time
Turn-Off Delay Time
Fall Time
VDD = 15V, ID = 18A
-
VGS = 10V, RGS = 4.3
-
-
tOFF
Turn-Off Time
-
Unclamped Inductive Switching
tAV
Avalanche Time
ID = 3.6A, L = 3mH
240
Drain-Source Diode Characteristics
VSD
Source to Drain Diode Voltage
trr
Reverse Recovery Time
QRR
Reverse Recovered Charge
ISD = 61A
-
ISD = 25A
-
ISD = 61A, dISD/dt = 100A/µs
-
ISD = 61A, dISD/dt = 100A/µs
-
Typ Max Units
-
-
V
-
1
µA
-
250
-
±100 nA
-
3
V
0.0052 0.0060
0.0085 0.0095
3400
-
pF
650
-
pF
300
-
pF
60
90
nC
30
45
nC
3.0
4.5
nC
10
-
nC
11
-
nC
-
131
ns
16
-
ns
70
-
ns
34
-
ns
30
-
ns
-
97
ns
-
80
ns
10
-
ns
43
-
ns
62
-
ns
29
-
ns
-
137
ns
-
-
µs
-
1.25
V
-
1.0
V
-
35
ns
-
30
nC
©2002 Fairchild Semiconductor Corporation
Rev. B, February 2002

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