MC10H136L 查看數據表（PDF） - ON Semiconductor
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MC10H136L Datasheet PDF : 8 Pages
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MC10H136
Table 1. FUNCTION SELECT TABLE
CIN S1 S2
Operating Mode
X L L Preset (Program)
L L H Increment (Count Up)
H L H Hold Count
L H L Decrement (Count Down)
H H L Hold Count
X H H Hold (Stop Count)
Table 2. SEQUENTIAL TRUTH TABLE*
INPUTS
OUTPUTS
S1
S2 D0 D1
D2
D3
Carry
In
Clock
**
Q0 Q1
Q2
Q3
Carry
Out
LLLLH H X
LH XX X X L
LH XX X X L
LH XX X X L
H LL HH L
H HL H H H
H LH H H H
H HH H H L
LH XX X X H
LH XX X X H
HH XX X X X
L L HH L L X
L HH H H H
H HH H H H
H HH H H H
H HH L L L
HL XX X X L H LH L L H
HL XX X X L
HL XX X X L
HL XX X X L
H HL L L H
H LL L L L
H HH H H H
* Truth table shows logic states assuming inputs vary in sequence shown from top to bottom.
** A clock H is defined as a clock input transition from a low to a high logic level.
VCC1
1
16
VCC2
Q2
2
15 Q1
Q3
3
14 Q0
COUT
4
D3
5
13 CLOCK
12 D0
D2
6
11 D1
S2
7
VEE
8
10
CIN
9
S1
Pin assignment is for Dual−in−Line Package.
Figure 1. Pin Assignment
Table 3. MAXIMUM RATINGS
Symbol
Characteristic
Rating
Unit
VEE
Power Supply (VCC = 0)
VI
Input Voltage (VCC = 0)
Iout
Output Current − Continuous
− Surge
−8.0 to 0
Vdc
0 to VEE
Vdc
50
mA
100
TA
Operating Temperature Range
Tstg
Storage Temperature Range − Plastic
− Ceramic
0 to +75
°C
−55 to +150
°C
−55 to +165
°C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
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