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MC74ACT08DTR2G(2004) 查看數據表(PDF) - ON Semiconductor

零件编号
产品描述 (功能)
生产厂家
MC74ACT08DTR2G
(Rev.:2004)
ON-Semiconductor
ON Semiconductor 
MC74ACT08DTR2G Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
MC74AC08, MC74ACT08
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Typ
Max
VCC
Supply Voltage
AC
ACT
2.0
5.0
6.0
4.5
5.0
5.5
Vin, Vout
tr, tf
DC Input Voltage, Output Voltage (Ref. to GND)
Input Rise and Fall Time (Note 1)
AC Devices except Schmitt Inputs
0
VCC @ 3.0 V
VCC @ 4.5 V
VCC @ 5.5 V
VCC
150
40
25
Input Rise and Fall Time (Note 2)
tr, tf
ACT Devices except Schmitt Inputs
VCC @ 4.5 V
10
VCC @ 5.5 V
8.0
TJ
Junction Temperature (PDIP)
140
TA
Operating Ambient Temperature Range
IOH
Output Current − High
IOL
Output Current − Low
−40
25
85
−24
24
1. Vin from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times.
2. Vin from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.
DC CHARACTERISTICS
74AC
74AC
Symbol
VIH
Parameter
Minimum High Level
Input Voltage
Conditions
VOUT = 0.1 V
or VCC − 0.1 V
TA =
−40°C to
VCC
TA = +25°C
+85°C
(V) Typ Guaranteed Limits
3.0
1.5 2.1
2.1
4.5 2.25 3.15
3.15
5.5 2.75 3.85
3.85
VIL
Maximum Low Level
Input Voltage
VOUT = 0.1 V
or VCC − 0.1 V
3.0
1.5 0.9
0.9
4.5 2.25 1.35
1.35
5.5 2.75 1.65
1.65
VOH
Minimum High Level
Output Voltage
IOUT = −50 mA
3.0 2.99 2.9
2.9
4.5 4.49 4.4
4.4
5.5 5.49 5.4
5.4
VIN = VIL or VIH (Note 3)
−12 mA
3.0
− 2.56
2.46
IOH
−24 mA
4.5
− 3.86
3.76
−24 mA
5.5
− 4.86
4.76
VOL
Maximum Low Level
Output Voltage
VIN = VIL or VIH(Note 3)
12 mA
IOL
24 mA
24 mA
3.0
− 0.36
0.44
4.5
− 0.36
0.44
5.5
− 0.36
0.44
IIN
Maximum Input
Leakage Current
VI = VCC, GND
5.5
±0.1
±1.0
IOLD
IOHD
ICC
Minimum Dynamic (Note 4)
Output Current
Maximum Quiescent
Supply Current
VOLD = 1.65 V Max
VOHD = 3.85 V Min
VIN = VCC or GND
5.5
75
5.5
−75
5.5
4.0
40
NOTE: IIN and ICC @ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V VCC.
3. All outputs loaded; thresholds on input associated with output under test.
4. Maximum test duration 2.0 ms, one output loaded at a time.
Unit
V
V
ns/V
ns/V
°C
°C
mA
mA
Unit
V
V
V
V
V
mA
mA
mA
mA
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