MC74HC365ADTR2G(2019) 查看數據表（PDF） - ON Semiconductor

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MC74HC365ADTR2G
(Rev.:2019)

Hex 3-State Noninverting Buffer with Common Enables

ON Semiconductor 

DEVICE

UNDER

TEST

TEST POINT

OUTPUT

CL*

MC74HC365A

TEST CIRCUITS

DEVICE

UNDER

TEST

TEST POINT

OUTPUT

1 kΩ

CL*

CONNECT TO VCC WHEN

TESTING tPLZ AND tPZL.

CONNECT TO GND WHEN

TESTING tPHZ AND tPZH.

*Includes all probe and jig capacitance

Figure 3.

*Includes all probe and jig capacitance

Figure 4.

LOGIC DETAIL

TO OTHER

FIVE BUFFERS

ONE OF 6

BUFFERS

VCC

Y

INPUT A

OUTPUT ENABLE 1

OUTPUT ENABLE 2

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