NCV7340 查看數據表（PDF） - ON Semiconductor
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NCV7340 Datasheet PDF : 11 Pages
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NCV7340
internal timer value tdom(TxD), the transmitter is disabled,
driving the bus into a recessive state. The timer is reset by a
positive edge on pin TxD.
This TxD dominant time−out time (tdom(TxD)) defines the
minimum possible bit rate to 40 kbps.
Fail Safe Features
A current−limiting circuit protects the transmitter output
stage from damage caused by accidental short circuit to
either positive or negative supply voltage, although power
dissipation increases during this fault condition.
The pins CANH and CANL are protected from
automotive electrical transients (according to ISO 7637; see
Figure 5). Pins TxD and STB are pulled high internally
should the input become disconnected. Pins TxD, STB and
RxD will be floating, preventing reverse supply should the
VCC supply be removed.
ELECTRICAL CHARACTERISTICS
Definitions
All voltages are referenced to GND (Pin 2). Positive currents flow into the IC. Sinking current means the current is flowing
into the pin; sourcing current means the current is flowing out of the pin.
Absolute Maximum Ratings
Table 4. ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Conditions
Min Max Unit
VCC
VCANH
VCANL
VSPLIT
VTxD
VRxD
VSTB
Vesd
Supply voltage
DC voltage at pin CANH
DC voltage at pin CANL
DC voltage at pin VSPLIT
DC voltage at pin TxD
DC voltage at pin RxD
DC voltage at pin STB
Electrostatic discharge voltage at all pins
0 < VCC < 5.25 V; no time limit
0 < VCC < 5.25 V; no time limit
0 < VCC < 5.25 V; no time limit
Note 1
Note 2
−0.3 +6
V
−50 +50
V
−50 +50
V
−40 +40
V
−0.3
6
V
−0.3
6
V
−0.3
6
V
−6
6
kV
−500 500
V
Electrostatic discharge voltage at CANH and CANL pins
Note 3
−12
12
kV
Latchup Static latchup at all pins
Note 4
120 mA
Tstg
Storage temperature
−55 +150 °C
TA
Ambient temperature
−40 +125 °C
TJ
Maximum junction temperature
−40 +170 °C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Standardized human body model electrostatic discharge (ESD) pulses in accordance to EIA−JESD22. Equivalent to discharging a 100 pF
capacitor through a 1.5 kW resistor.
2. Standardized charged device model ESD pulses when tested according to ESD−STM5.3.1−1999.
3. System human body model electrostatic discharge (ESD) pulses. Equivalent to discharging a 150 pF capacitor through a 330 W resistor.
4. Static latchup immunity: Static latchup protection level when tested according to EIA/JESD78.
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