NE5550234 查看數據表（PDF） - Renesas Electronics
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NE5550234 Datasheet PDF : 16 Pages
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NE5550234
TEST CIRCUIT SCHEMATIC FOR 157 MHz
VGS
VDS
IN
50 Ω C10
C11
R1
C1
L1
C2
L10
R10
NE5550234
L11
C22
C20
C21
OUT
50 Ω
COMPONENTS OF TEST CIRCUIT FOR MEASURING ELECTRICAL CHARACTERISTICS
Symbol
C10
C11
C20
C21
C22
C1
C2
L10
L11
L1
<R>
R10
R1
<R>
PCB
SMA Connecter
Value
27 pF
6.8 pF
8.2 pF
27 pF
100 pF
1 μF
1 μF
100 nH
47 nH
74 nH
5.6 Ω
4.7 kΩ
−
−
Type
GQM1882C1H270JB01
GQM1882C1H6R8DB01
GQM1882C1H8R2DB01
GQM1882C1H270JB01
GQM1882C1H101JB01
GRM21BB31H105KA2L
GRM21BB31H105KA2L
LL1608-FSLR10J
D20-47N2
D20-74N7
MCR03J5R6
MCR03J472
R1766, t = 0.8 mm, εr = 4.8, size = 30 × 40 mm
WAKA 01K0790-20
Maker
Murata
Murata
Murata
Murata
Murata
Murata
Murata
Toko
Ohesangyou
Ohesangyou
Rohm
Rohm
Panasonic
WAKA
R09DS0039EJ0300 Rev.3.00
Mar 12, 2013
Page 5 of 14
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