DATA SHEET
DC CHARACTERISTICS
CMOS Compatible
Parameter
Description
Test Conditions
Min
Typ
Max
Unit
ILI
Input Load Current
VIN = VSS to VCC,
VCC = VCC max
ILIT
A9, OE#, RESET Input Load
Current
VCC = VCC max,
A9 = OE# = RESET = 12.5 V
±1.0
µA
35
µA
ILO
Output Leakage Current
ICC1
VCC Active Read Current
(Note 2)
VOUT = VSS to VCC,
VCC = VCC max
CE# = VIL, OE# = VIH,
f = 5 MHz
Byte Mode
CE# = VIL, OE# = VIH,
f = 5 MHz
Word Mode
±1.0
µA
20
40
mA
28
50
mA
ICC2
VCC Active Write Current
(Notes 1, 2, 3)
CE# = VIL, OE# = VIH
30
50
mA
ICC3
VCC Standby Current (Note 2)
CE# and RESET# = VCC±0.5 V,
OE# = VIH
0.3
5
µA
VIL
Input Low Voltage
–0.5
0.8
V
VIH
Input High Voltage
0.7 x VCC
VCC + 0.3 V
VID
Voltage for Autoselect and
Temporary Sector Unprotect
VCC = 5.0 V
11.5
12.5
V
VOL
VOH1
VOH2
VLKO
Output Low Voltage
Output High Voltage
Low VCC Lock-Out Voltage
(Note 3)
IOL = 5.8 mA, VCC = VCC min
IOH = –2.5 mA, VCC = VCC min
IOH = –100 µA, VCC = VCC min
0.85 VCC
VCC–0.4
3.2
0.45
V
V
V
4.2
V
Notes:
1. ICC active while Embedded Erase or Embedded Program is in progress.
2. Maximum ICC specifcations are tested with VCC = VCCmax
3. Not 100% tested.
November 2, 2006 21504E5
Am29F800B
25