SL432XSF 查看數據表（PDF） - AUK -> KODENSHI CORP
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SL432XSF Datasheet PDF : 5 Pages
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SL432xSF
Fig. 1 Test circuit for VKA=Vref
Input
VKA
IK
Fig. 2 Test circuit for VKA>Vref
Input
VKA
R1
IK
Iref
R2
Fig. 3 Test circuit for IK(off)
Input
VKA
IK(off)
Vref
V ref
=
Vref
× (1 +
R1
R2
)
+
I ref
× R1
Note.
1. Ambient temperature range: TLOW = -40℃, THigh = 85℃
2. The deviation parameters △Vref and △Iref are defined as the difference between the maximum value and minimum value
obtained over the full operating ambient temperature range that applied.
∆Vref = Vref Max – Vref Min
∆Ta = T2 – T1
Ambient Temperature
The average temperature coefficient of the reference input voltage, αVref is defined as:
(
∆Vref
×106 )
ppm
α Vref ( ℃ ) =
Vref (Ta = 25℃)
Ta
αVref can be positive or negative depending on whether Vref Min or Vref Max occurs at the lower ambient temperature, refer to
Fig. 8
Example : △Vref = 10mV and the slope is positive,
△Vref @ 25℃ = 1.24V
△Ta = 125℃
ppm
αVref ( ℃ ) =
( 0.010 ) ×106
1.241
125
= 65ppm /℃
3. The dynamic impedance ZKA is defined as:
Ζ KA
= ∆VKA
∆I K
When the device is operating with two external resistors, R1 and R2, (refer to Fig.2) the total dynamic impedance of the circuit
is given by:
Ζ KA '
=
Ζ KA
× (1+ R1 )
R2
KSI-2015-005
3
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