Table 4. AC Characteristics
Applicable over recommended operating range from TAI = −40°C to + 85°C, TAE = −40°C to +125°C, VCC = As Specified,
CL = 1 TTL Gate and 100 pF (unless otherwise noted)
Symbol
Parameter
Test Condition
Min
Typ
Max
Units
fSK
SK Clock
Frequency
4.5V ≤ VCC ≤ 5.5V
2.7V ≤ VCC ≤ 5.5V
1.8V ≤ VCC ≤ 5.5V
0
2
0
1
MHz
0
0.25
tSKH
SK High Time
2.7V ≤ VCC ≤ 5.5V
1.8V ≤ VCC ≤ 5.5V
250
1000
ns
tSKL
SK Low Time
2.7V ≤ VCC ≤ 5.5V
1.8V ≤ VCC ≤ 5.5V
250
1000
ns
tCS
Minimum CS
Low Time
2.7V ≤ VCC ≤ 5.5V
1.8V ≤ VCC ≤ 5.5V
250
1000
ns
tCSS
CS Setup Time
Relative to SK
2.7V ≤ VCC ≤ 5.5V
1.8V ≤ VCC ≤ 5.5V
50
200
ns
tDIS
DI Setup Time
Relative to SK
2.7V ≤ VCC ≤ 5.5V
1.8V ≤ VCC ≤ 5.5V
100
400
ns
tCSH
CS Hold Time
Relative to SK
0
ns
tDIH
DI Hold Time
Relative to SK
2.7V ≤ VCC ≤ 5.5V
1.8V ≤ VCC ≤ 5.5V
100
400
ns
tPD1
Output Delay to “1” AC Test
2.7V ≤ VCC ≤ 5.5V
1.8V ≤ VCC ≤ 5.5V
250
1000
ns
tPD0
Output Delay to “0” AC Test
2.7V ≤ VCC ≤ 5.5V
1.8V ≤ VCC ≤ 5.5V
250
1000
ns
tSV
CS to Status Valid AC Test
2.7V ≤ VCC ≤ 5.5V
1.8V ≤ VCC ≤ 5.5V
250
1000
ns
tDF
CS to DO in High
Impedance
AC Test
CS = VIL
2.7V ≤ VCC ≤ 5.5V
1.8V ≤ VCC ≤ 5.5V
150
400
ns
tWP
Write Cycle Time
1.8V ≤ VCC ≤ 5.5V
0.1
3
10
ms
ms
Endurance(1)
5.0V, 25°C
1M
Write Cycles
Note: 1. This parameter is ensured by characterization.
4 AT93C86A
3408H–SEEPR–1/07