GTLP6C816 查看數據表（PDF） - Pericom Semiconductor
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GTLP6C816 Datasheet PDF : 6 Pages
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GTLP6C816
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Test Circuits and Timing Waveforms
Test Circuit for A Outputs
OUFunTrtdopeemusrtt
CL = 50pF
(Note A)
500Ω
500Ω
6V
Open
Gnd
tttPPPTLLHHZeZ///stttPtPPZHZHHL
S
Open
6V
GND
Note A: CL includes probes and jig capacitance
Test Circuit for B Outputs
1.5V (GTLP)
1.2V (GTL)
From
Output
Under
Test
25Ω
30pF
(Notes A & B)
Notes:
A. CL includes probes and jig capacitance.
B.
For B-Port outputs,
worst case.
CL
=
30pF
is
used
for
Voltage Waveforms Enable
and Disable Times A-Port
3.0V
1.5V
1.5V
tPZL
1.5V
tPZH
1.5V
VOH
VOL+0.3V VOL
VOH-0.3V VOH
VOL
24-Pin 173 Mil Wide Plastic TSSOP Package
24
Voltage Waveforms Propagation Delay
(Vm = 1.5V for A-Port and 1.0 for B-Port)
Input
tPHL
tPHL
VmV
Output
VmV
3.0V
(1.5V for B-Port GTLP)
0V
VOH
(1.5V for B-Port GTLP)
VOL
.169 4.3
.177 4.5
1
.303
.311
7.7
7.9
.047
1.20
Max
SEATING
PLANE
.0256
BSC
0.65
.007
.012
0.19
0.30
.002 0.05
.006 0.15
0.45 .018
0.75 .030
.252
BSC
6.4
.004 0.09
.008 0.20
X.XX DENOTES CONTROLLING
X.XX DIMENSIONS IN MILLIMETERS
Pericom Semiconductor Corporation
2380 Bering Drive • San Jose, CA 95131 • 1-800-435-2336 • Fax (408) 435-1100 • http://www.pericom.com
6
PS8426A 03/15/00
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