AD9660–SPECIFICATIONS (+VS = +5 V, Temperature = +25°C unless otherwise noted. Sourced currents defined
as positive.)
Parameter
Test
AD9660KR
Level Temp Min Typ Max
Units Conditions
ANALOG INPUTS
(WRITE LEVEL, BIAS LEVEL)
Input Voltage Range
Input Bias Current
Analog Bandwidth
IV
Full
VREF
I
+25°C –50
V
Full
25
VREF + 1.6 V
+50
µA
MHz
External Hold Cap = 20 pF
OUTPUTS
Maximum Output Current, IOUT
I
IOUT
I
Bias Current, IBIAS
I
Modulation Current, IMODULATION
I
Offset Current, IOFFSET
I
Output Compliance Range
I
Idle Current
I
+25°C 200
+25°C 180
+25°C 90
+25°C 60
+25°C 30
+25°C 0
+25°C 3
mA
VOUT = 2.5 V
mA
VOUT = 3.0 V
mA
VOUT = 3.0 V
mA
VOUT = 3.0 V
mA
VOUT = 3.0 V
3.0
V
13
mA
WRITE PULSE = LOW,
DISABLE = HIGH
SWITCHING PERFORMANCE
Maximum Pulse Rate
IV
Output Propagation Delay (tPD), Rising1 IV
Output Propagation Delay (tPD), Falling1 IV
Output Current Rise Time2
IV
Output Current Fall Time3
IV
WRITE CAL Aperture Delay4
V
Disable Time5
V
+25°C 200 250
Full 1.6
3.0
Full 1.6
2.5
Full 1.1 1.5 1.7
Full 1.4 2.0 2.8
+25°C
13
+25°C
5
MHz
ns
ns
ns
ns
ns
ns
3 dB Reduction in IOUT
HOLD NODES
(WRITE HOLD, BIAS HOLD)
Input Bias Current
Input Voltage Range
Minimum External Hold Cap
TTL INPUTS6
Logic “1” Voltage
Logic “1” Voltage
Logic “0” Voltage
Logic “0” Voltage
Logic “1” Current
Logic “0” Current
I
+25°C –200
IV
Full
VREF
V
Full
20
I
+25°C 2.0
IV Full 2.0
I
+25°C
IV Full
I
+25°C –10 20
I
+25°C –1.5
200
nA
VREF + 1.6 V
pF
V
V
0.8
V
0.8
V
10
µA
mA
VHOLD = 2.5 V
Open Loop Application Only
DISABLE = LOW
While Other
TTL Inputs Are
Tested
BANDGAP REFERENCE
Output Voltage VREF
Temperature Coefficient
Output Current
I
+25°C 1.55 1.75 1.90
V
–0.2
V
+25°C –0.5
1.0
V
mV/°C
mA
SENSE IN
Current Gain
Voltage
Input Resistance
V
+25°C
1.85
I
+25°C 3.7 4.0 4.3
V
+25°C
<150
mA/mA
V
Ω
IMONITOR = 2 mA
POWER SUPPLY (DISABLE = HIGH)
+VS Voltage
I
+VS Current
I
Power Dissipation
I
+25°C 4.75 5.00 5.25
+25°C 75 110 150
+25°C
550
V
DISABLE = HIGH
mA
mW
OFFSET CURRENT
OFFSET SET Voltage
I
+25°C 1.1 1.4 1.7
V
IMONITOR = 4.0 mA
NOTES
1Propagation delay measured from the 50% of the rising/falling transition of WRITE PULSE to 50% point of the rising/falling edge of the output modulation current.
2Rise time measured between the 10% and 90% points of the rising transition of the modulation current.
3Fall time measured between the 10% and 90% points of the falling transition of the modulation current.
4Aperture Delay is measured from the 50% point of the rising edge of WRITE PULSE to the time when the output modulation begins to recalibrate, WRITE CAL is
held during this test.
5Disable Time is measured from the 50% point of the rising edge of DISABLE to the 50% point of the falling transition of the output current. Fall time during disable
is similar to fall time during normal operation.
6WRITE PULSE, WRITE CAL, BIAS CAL, OFFSET PULSE are TTL compatible inputs.
Specifications subject to change without notice.
–2–
REV. 0