SPMWHT541MD7WAW0S0 查看數據表（PDF） - Samsung

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SPMWHT541MD7WAW0S0

5630 Middle Power LED for High CRI

Samsung 

5. Reliability Test Items and Conditions

1) Test Items

Test Item

MSL Test

Room Temperature

life test

High Temperature

life test

High Temperature

humidity life test

Low Temperature

life test

Powered Temperature

Cycle test

Thermal Shock

High Temperature

Storage

Low Temperature

Storage

ESD(HBM)

ESD(MM)

Test Conditions

125 ℃ 24hrs drying → 60 ℃, 60 %RH 120hrs

→ 260 ℃ 10sec 3 cycles

25 ℃±3 ℃, DC150 ㎃

85 ℃±3 ℃, DC150 ㎃

85 ℃±3 ℃, 85 %±2 %RH, DC150 ㎃

-40 ℃±3 ℃, DC150 ㎃

-45℃/20 min ↔ 85℃/20 min, Sweep

100min cycle on/off: each 5 min, DC 150mA

-45 ℃/15 min ↔ 125 ℃/15 min

→ Hot plate 180 ℃

Ta=120 ℃±3 ℃

Ta=-40 ℃±3 ℃

R1:10 ㏁,

R2:1.5 ㏀,

C:100 ㎊,

V = ±5 kV

R1:10 ㏁,

R2: 0,

C:200 ㎊,

V = ±0.5 kV

Test

Hours/Cycles

1 cycle

1,000 hrs

1,000 hrs

1,000 hrs

1,000 hrs

100 cycle

500 cycle

1000 hrs

1000 hrs

5 times

5 times

Sample No

11

22

22

22

22

22

100

11

11

5

5

Vibration Test

20~2000~20 Hz 200 m/SZ, Sweep 4 min

X, Y, Z 3 direction, each 1 cycle

4 cycles

11

Mechanical Shock Test

1500G, 0.5 ms,

3 shocks each X-Y-Z axis

5 cycles

11

2) Criteria for Judging the Damage

Item

Forward Voltage

Luminous Flux

Symbol

VF

Φv

Test Condition

IF = 65 ㎃

IF = 65 ㎃

Limit

Min

Max

Init. Value*0.9

Init. Value*1.1

Init. Value*0.7

Init. Value*1.2

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