74HC132-Q100 查看數據表（PDF） - NXP Semiconductors.
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74HC132-Q100 Datasheet PDF : 19 Pages
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Nexperia
74HC132-Q100; 74HCT132-Q100
Quad 2-input NAND Schmitt trigger
VI 90 %
negative
pulse
GND
VI
positive
pulse
GND 10 %
VM
10 %
tf
tr
90 %
VM
G
VI
RT
tW
tW
VCC
DUT
VM
tr
tf
VM
VO
CL
001aah768
Test data is given in Table 9.
Definitions test circuit:
RT = termination resistance should be equal to output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
Figure 7. Test circuit for measuring switching times
Table 9. Test data
Type
74HC132-Q100
74HCT132-Q100
Input
VI
VCC
3.0 V
tr, tf
6.0 ns
6.0 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
Test
tPLH, tPHL
tPLH, tPHL
74HC_HCT132_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 4 — 12 June 2018
© Nexperia B.V. 2018. All rights reserved.
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