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ISL54405 查看數據表(PDF) - Renesas Electronics

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ISL54405 Datasheet PDF : 20 Pages
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ISL54405
Test Circuits and Waveforms (Continued)
LOGIC
INPUT
VDD
0V
SWITCH
OUTPUT
VOUT 0V
VNX
90%
tD
LOGIC
INPUT
VDD C
Lx
R OR L
Rx
SEL
GND MUTE
VOUT
RL
CL
FIGURE 3A. MEASUREMENT POINTS
Repeat test for all switches. CL includes fixture and stray capacitance.
FIGURE 3B. TEST CIRCUIT
FIGURE 3. BREAK-BEFORE-MAKE TIME
SIGNAL
GENERATOR
VDD
C
MUTE
Lx or Rx
SEL 0V OR VDD
rON = V1/80mA
Lx or Rx
VNX
80mA
V1
VDD
C
SEL 0V OR VDD
ANALYZER
RL
L, R
GND
L, R
GND MUTE
Signal direction through switch is reversed, worst case values
are recorded. Repeat test for all switches.
FIGURE 4. OFF-ISOLATION TEST CIRCUIT
SIGNAL
GENERATOR
VDD
C
Lx OR Rx
L, R
SEL
0V OR VDD
L, R
Lx or Rx
ANALYZER
NC
GND MUTE
RL
Signal direction through switch is reversed, worst case values
are recorded. Repeat test for all switches.
FIGURE 6. CROSSTALK TEST CIRCUIT
Repeat test for all switches.
FIGURE 5. rON TEST CIRCUIT
IMPEDANCE
ANALYZER
Lx or Rx
VDD
C
SEL 0V OR VDD
L, R
GND MUTE
Repeat test for all switches.
FIGURE 7. CAPACITANCE TEST CIRCUIT
FN6699 Rev 2.00
May 6, 2014
Page 7 of 20

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