C8051F97X View Datasheet(PDF) - Silicon Laboratories

Part Name

Description

Manufacturer

C8051F97X

Low Power Capacitive Sensing MCU with up to 32 kB of Flash

Silicon Laboratories 

1.2. Thermal Conditions

Table 1.15. Thermal Characteristics

Parameter

Thermal Resistance 

Junction to Ambient

Thermal Resistance 

Junction to Case

Symbol

JA

JC

Conditions

Still air, QFN 48

Still air, QFN 32

Still air, QFN 24

Still air, QFN 48

Still air, QFN 32

Still air, QFN 24

Min Typ Max

—

82

—

— 40.4 —

— 59.5 —

— 11.5 —

— 16.8 —

— 22.7 —

Units

°C/W

°C/W

1.3. Absolute Maximum Ratings

Stresses above those listed under Table 1.16 may cause permanent damage to the device. This is a stress rating

only and functional operation of the devices at those or any other conditions above those indicated in the operation

listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect

device reliability.

For more information on the available quality and reliability data, see the Quality and Reliability Monitor Report at

http://www.silabs.com/support/quality/pages/default.aspx.

Table 1.16. Absolute Maximum Limits

Parameter

Ambient Temperature under Bias

Storage Temperature

Voltage on any Port I/O Pin or RST

with Respect to GND

Voltage on VDD with Respect to

GND

Maximum Total Current through VDD

or GND

Maximum Current through RST or

any Port Pin

Maximum Total Current through all

Port Pins

Conditions

Min

Typ

–55

—

–65

—

–0.3

—

–0.3

—

—

—

—

—

—

—

Note: Exposure to maximum rating conditions for extended periods may affect device reliability.

Max

125

150

VDD + 0.3

4.0

500

100

200

Units

°C

°C

V

V

mA

mA

mA

21

Rev 1.1

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