74HC259BQ View Datasheet(PDF) - NXP Semiconductors.

Part Name

Description

Manufacturer

74HC259BQ

8-bit addressable latch

NXP Semiconductors. 

NXP Semiconductors

74HC259; 74HCT259

8-bit addressable latch

VI 90 %

tW

negative

pulse

VM

10 %

0V

tf

VI

positive

pulse

tr

90 %

VM

10 %

0V

tW

VM

tr

tf

VM

VI

G

VCC

VO

DUT

RT

VCC

RL S1

CL

open

001aad983

Test data is given in Table 10.

Definitions test circuit:

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

CL = Load capacitance including jig and probe capacitance.

RL = Load resistance.

S1 = Test selection switch

Fig 12. Load circuit for measuring switching times

Table 10. Test data

Type

Input

74HC259

74HCT259

VI

tr, tf

VCC

6 ns

3V

6 ns

Load

CL

15 pF, 50 pF

15 pF, 50 pF

RL

1 kΩ

1 kΩ

S1 position

tPHL, tPLH

open

open

74HC_HCT259_4

Product data sheet

Rev. 04 — 25 February 2009

© NXP B.V. 2009. All rights reserved.

13 of 21

Share Link: