Thermal Characteristics
6
Thermal Characteristics
Table 16. Thermal Characteristics
Characteristic
Natural Convection, Junction-to-ambient thermal
resistance1,2
Junction-to-case thermal resistance3
Symbol
RθJA or θJA
RθJC or θJC
LQFP Values
68 (52 LQFP)
50 (80 LQFP)
17 (52 LQFP)
11 (80 LQFP)
Unit
°C/W
°C/W
Note:
1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site
(board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board
thermal resistance.
2. Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3. Thermal resistance between the die and the case top surface as measured by the cold plate method
(MIL SPEC-883 Method 1012.1).
7
DC Electrical Characteristics
Table 17. DC Electrical Characteristics
Characteristics
Symbol
Min
Typ
Max
Unit
Supply voltages
• Core (Core_VDD)
• PLL (PLLD_VDD)
VDD
1.2
1.25
1.3
V
Supply voltages
• VIO_VDD
• PLL (PLLP_VDD)
• PLL (PLLA_VDD)
VDDIO
3.14
3.3
3.46
V
Input high voltage
V
• All pins
VIH
2.0
—
VIO_VDD+2V
Note: All 3.3 volt supplies must rise prior to the rise of the 1.25 volt supplies to avoid a high current condition and possible system
damage.
Input low voltage
• All pins
VIL
–0.3
—
Input leakage current
IIN
—
—
Clock pin Input Capacitance (EXTAL)
CIN
4.7
High impedance (off-state) input current (@ 3.46V)
ITSI
–10
—
Output high voltage
IOH = -5 mA.
XTAL Pin IOH = -10mA
VOH
2.4
—
Output low voltage
IOH = 5 mA.
XTAL Pin IOH = 10mA
VOL
—
—
0.8
V
± 84
µA
pF
84
µA
—
V
0.4
V
26
PRELIMINARY
Freescale Semiconductor