SFT825N-S View Datasheet(PDF) - SEOUL SEMICONDUCTOR

Part Name

Description

Manufacturer

SFT825N-S

surface-mount LED comes in PLCC standard package

SEOUL SEMICONDUCTOR 

12. Reliability Test Item and Condition

Item

Thermal Shock

Temperature

Cycle

High

Temperature

Storage

High

Temperature

High Humidity

Storage

Low

Temperature

Storage

Operating

Endurance Test

High

Temperature

High Humidity

Life Test

High

Temperature

Life Test

Low

Temperature

Life Test

ESD(HBM)

Reference

EIAJ ED-

4701

EIAJ ED-

4701

EIAJ ED-

4701

EIAJ ED-

4701

EIAJ ED-

4701

Internal

Reference

Internal

Reference

Internal

Reference

Internal

Reference

MIL-STD-

883D

Test Condition

Ta =-40oC (30MIN) ~ 100oC

(30MIN)

Duration

/ Cycle

100

Cycle

Number

of

Damage

0/22

Ta =-40oC (30MIN) ~ 25oC (5MIN) 100

~ 100oC (30MIN) ~ 25oC (5MIN) Cycle

0/22

Ta =100oC

1000

Hours

0/22

Ta =85oC, RH=85%

1000

Hours

0/22

Ta =-40oC

Ta =25oC, IF =20mA

Ta =85oC, RH=85%, IF =15mA

1000

Hours

1000

Hours

300

Hours

0/22

0/22

0/22

Ta =85oC, IF =20mA

Ta =-40oC, IF =20mA

1KV at 1.5kΩ; 100pF

500

Hours

1000

Hours

3 Time

0/22

0/22

0/22

Criteria for Judging the Damage

Item

Symbol

Condition

Forward Voltage

VF

IF =20mA

Reverse Current

IR

Luminous

Intensity

IV

VR=5V

IF =20mA

Note : *1 USL : Upper Standard Level

*2 LSL : Lower Standard Level

Criteria for Judgement

MIN

MAX

-

USL*1 × 1.2

-

USL*1 × 2.0

LSL*2 × 0.5

-

Rev. 07

June 2009

www.acriche.com

Document No. : SSC-QP-7-07-24 (Rev.00)

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