CXD2434TQ View Datasheet(PDF) - Sony Semiconductor

Part Name

Description

Manufacturer

CXD2434TQ

Timing Generator for Progressive Scan CCD Image Sensor

Sony Semiconductor 

CXD2434TQ

6. Mode settings

6-1. VD input-related

BUSY

SMD1

L

H

H

L

X

X

SMD2

H

L

H

X

SMDE

X

L

H

X

EFS

VD input

Invalid

X

Exposure is started from the first VD input.

Readout operation or the number of

accumulated frames is counted.

H

Readout operation is performed.

L

Invalid

Note 1) When PS is high, SMD1 and SMD2 indicate the status of the SMD1 and SMD2 pins, respectively.

When PS is low, these are the corresponding internal register values. See “2. Electronic shutter”.

Note 2) Operation when PS = high, SMD1 = low and SMD2 = low conforms to that when SMD1 = low and

SMD2 = high.

6-2. TRIG, ESG and EFS input-related

BUSY

H

L

Discharge period

(Note 1)

Exposure period

Signal output period

Before TRIG input

After TRIG input

(Note 2) (Note 3)

SMDE

X

H

L

X

TRIG

Prohibited

IC shifted to

external trigger

mode (Note 3)

Prohibited

ESG

EFS

Prohibited

Invalid

Readout operation (Note 4)

Prohibited

Discharge operation

(Note 6)

Prohibited (Note 5)

Prohibited

Note 1) Only when FSE is high.

Note 2) Valid only during low-speed shutter.

Note 3) See “3. External trigger mode”.

Note 4) ESG input is valid only one time after TRIG input. Do not input ESG two times or more.

Note 5) Fix ESG to high status when BUSY is low.

Note 6) When EFS is low, readout is not activated by VD input. See “6-1. VD input-related”.

6-3. WEN mode switching by WM

WM

Description of WEN operation

L

Lines for which the signal from the CCD is valid output high; all other lines output low.

H

Output is synchronized with XSG.

—13—

Share Link: