MKL33Z128VLH4 View Datasheet(PDF) - NXP Semiconductors.

Part Name

Description

Manufacturer

MKL33Z128VLH4

Kinetis KL33 Microcontroller 48 MHz ARM® Cortex®-M0+ and 128/256 KB Flash

NXP Semiconductors. 

General

Cell and Wideband TEM Cell Method. Measurements were made while the microcontroller was running basic

application code. The reported emission level is the value of the maximum measured emission, rounded up to the next

whole number, from among the measured orientations in each frequency range.

2. VDD = 3.3 V, TA = 25 °C, fOSC = IRC48M, fSYS = 48 MHz, fBUS = 24 MHz

3. Specified according to Annex D of IEC Standard 61967-2, Measurement of Radiated Emissions—TEM Cell and

Wideband TEM Cell Method

2.2.7 Designing with radiated emissions in mind

To find application notes that provide guidance on designing your system to minimize

interference from radiated emissions:

1. Go to www.freescale.com.

2. Perform a keyword search for “EMC design.”

2.2.8 Capacitance attributes

Table 12. Capacitance attributes

Symbol

CIN

Description

Input capacitance

Min.

Max.

Unit

—

7

pF

2.3 Switching specifications

2.3.1 Device clock specifications

Table 13. Device clock specifications

Symbol Description

Normal run mode

fSYS

fBUS

fFLASH

fLPTMR

System and core clock1

Bus clock1

Flash clock1

LPTMR clock

VLPR and VLPS modes2

fSYS

fBUS

fFLASH

fLPTMR

fLPTMR_ERCLK

System and core clock

Bus clock

Flash clock

LPTMR clock3

LPTMR external reference clock

Table continues on the next page...

Min.

—

—

—

—

—

—

—

—

—

Max.

48

24

24

24

4

1

1

24

16

Unit

MHz

MHz

MHz

MHz

MHz

MHz

MHz

MHz

MHz

20

Freescale Semiconductor, Inc.

Kinetis KL33 Microcontroller, Rev.5, 08/2015.

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