DSP56F826PB View Datasheet(PDF) - Freescale Semiconductor

Part Name

Description

Manufacturer

DSP56F826PB

16-bit Digital Signal Controllers

Freescale Semiconductor 

Signals and Package Information

Table 2-1 56F826 Signal and Package Information for the 100 Pin LQFP (Continued)

Signal

Name

RD

WR

TA0

(GPIOF0)

TA1

(GPIOF1)

TA2

(GPIOF2)

TA3

(GPIOF3)

TCK

TMS

Pin No.

Type

Description

26

Output

Read Enable—RD is asserted during external memory read cycles. When RD is

asserted low, pins D0–D15 become inputs and an external device is enabled

onto the device data bus. When RD is deasserted high, the external data is

latched inside the device. When RD is asserted, it qualifies the A0–A15, PS, and

DS pins. RD can be connected directly to the OE pin of a Static RAM or ROM.

27

Output

Write Enable—WR is asserted during external memory write cycles. When WR

is asserted low, pins D0–D15 become outputs and the device puts data on the

bus. When WR is deasserted high, the external data is latched inside the

external device. When WR is asserted, it qualifies the A0–A15, PS, and DS pins.

WR can be connected directly to the WE pin of a Static RAM.

91

Input/Output TA0–3—Timer A Channels 0, 1, 2, and 3

Input/Output Port F GPIO—These four General Purpose I/O (GPIO) pins can be individually

90

programmed as input or output.

89

After reset, the default state is Quad Timer.

88

100

Input

Test Clock Input—This input pin provides a gated clock to synchronize the test

(Schmitt) logic and shift serial data to the JTAG/OnCE port. The pin is connected internally

to a pull-down resistor.

1

Input

Test Mode Select Input—This input pin is used to sequence the JTAG TAP

(Schmitt) controller’s state machine. It is sampled on the rising edge of TCK and has an

on-chip pull-up resistor.

TDI

TDO

TRST

Note: Always tie the TMS pin to VDD through a 2.2K resistor.

2

Input

Test Data Input—This input pin provides a serial input data stream to the

(Schmitt) JTAG/OnCE port. It is sampled on the rising edge of TCK and has an on-chip

pull-up resistor.

3

Output

Test Data Output—This tri-statable output pin provides a serial output data

stream from the JTAG/OnCE port. It is driven in the Shift-IR and Shift-DR

controller states, and changes on the falling edge of TCK.

4

Input

Test Reset—As an input, a low signal on this pin provides a reset signal to the

(Schmitt) JTAG TAP controller. To ensure complete hardware reset, TRST should be

asserted whenever RESET is asserted. The only exception occurs in a

debugging environment when a hardware device reset is required and it is

necessary not to reset the JTAG/OnCE module. In this case, assert RESET, but

do not assert TRST. TRST must always be asserted at power-up.

Note: For normal operation, connect TRST directly to VSS. If the design is to be used

in a debugging environment, TRST may be tied to VSS through a 1K resistor.

DE

98

Output

Debug Event—DE provides a low pulse on recognized debug events.

56F826 Technical Data, Rev. 14

Freescale Semiconductor

13

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