LH28F008SCL-12 View Datasheet(PDF) - Sharp Electronics

Part Name

Description

Manufacturer

LH28F008SCL-12

Flash Memory 8M (1M ×8)

Sharp Electronics 

SHARP

LHF08CH3

26

1

2.2 AC INPUT/OUTPUT TEST CONDITIONS

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AC test inputs are driven at 2.7V for a Logic “1” and O.OV for a Logic “0.” Input timing begins, and output timing ends, at 1.35V.

input rise and fall times (10% to 90%) <IO ns.

1

Figure 11. Transient Input/Output Reference Waveform for Vcc=2.7V-3.6V

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AC test inputs are driven at 3.OV for a Logic “1” and O.OV for a Logic “0.” Input timing begins, and output timing ends, at 1.W.

Input rise and fall times (10% to 90%) ~10 ns.

Figure 12. Transient Input/Output Reference Waveform for VCc=3.3Vi0.3V

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AC test inputs are driven at VOH (2.4 VTTL) for a Logic “1” and VOL (0.45 VTTL) for a Logic “0.” Input timing begins at V+

(2.0 V~L) and VIL (0.8 V~L). Output timing ends at VIH and VIL. Input rise and fall times (10% to 90%) ~10 ns.

Figure 13. Transient Input/Output Reference Waveform for Vcc=5V*0.5V

1.3v

l-

T IN914

Test Confi uration Ca acitance Loadin Value

1

DEVICE

UNDER

TEST

CL Includes Jig

Capacitance

0 OUT

Figure 14. Transient Equivalent Testing

Load Circuit

Rev. 1.2

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