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SIM3C134 View Datasheet(PDF) - Silicon Laboratories

Part Name
Description
Manufacturer
SIM3C134 Datasheet PDF : 90 Pages
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SiM3C1xx
Table 3.7. Flash Memory
Parameter
Symbol
Test Condition
Min Typ Max Unit
Write Time1
Erase Time1
tWRITE One 16-bit Half Word 20
21
22
µs
tERASE
One Page
20
21
22
ms
tERALL
Full Device
20
21
22
ms
VDD Voltage During Programming
VPROG
1.8
3.6
V
Endurance (Write/Erase Cycles)
Retention2
NWE
20k
tRET TA = 25 °C, 1k Cycles 10
100k
100
— Cycles
Years
Notes:
1. Does not include sequencing time before and after the write/erase operation, which may take up to 35 µs. During a
sequential write operation, this extra time is only taken prior to the first write and after the last write.
2. Additional Data Retention Information is published in the Quarterly Quality and Reliability Report.
Table 3.8. Internal Oscillators
Parameter
Symbol
Test Condition
Min Typ Max Unit
Phase-Locked Loop (PLL0OSC)
Calibrated Output Frequency*
fPLL0OSC Full Temperature and 77
79
80
MHz
Supply Range
Power Supply Sensitivity*
PSSPLL0OSC
TA = 25 °C,
Fout = 79 MHz
430
— ppm/V
Temperature Sensitivity*
TSPLL0OSC
VDD = 3.3 V,
Fout = 79 MHz
95
— ppm/°C
Adjustable Output Frequency
Range
Lock Time
fPLL0OSC
23
80
MHz
tPLL0LOCK
fREF = 20 MHz,
1.7
µs
fPLL0OSC = 80 MHz,
M=24, N=99,
LOCKTH = 0
fREF = 32 kHz,
91
µs
fPLL0OSC = 80 MHz,
M=0, N=2440,
LOCKTH = 0
*Note: PLL0OSC in free-running oscillator mode.
Rev.1.0
15

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