S25FL127SABMFI003 View Datasheet(PDF) - Cypress Semiconductor

Part Name

Description

Manufacturer

S25FL127SABMFI003

128-Mbit (16 Mbyte) 3.0 V SPI Flash Memory

Cypress Semiconductor 

5.2 AC Test Conditions

Figure 21. Test Setup

Device

Under

Test

CL

S25FL127S

Table 9. AC Measurement Conditions

Symbol

CL

Parameter

Load Capacitance

Input Rise and Fall

Times

Input Pulse Voltage

Input Timing Ref Voltage

Output Timing Ref

Voltage

Min

Max

30

2.4

0.2 x VCC to 0.8 VCC

0.5 VCC

0.5 VCC

Notes:

1. Output High-Z is defined as the point where data is no longer driven.

2. Input slew rate: 1.5 V/ns.

3. AC characteristics tables assume clock and data signals have the same slew rate (slope).

5.2.1

Capacitance Characteristics

Table 10. Capacitance

CIN

COUT

Parameter

Test Conditions

Min

Input Capacitance (applies to SCK, CS#, RESET#)

1 MHz

Output Capacitance (applies to All I/O)

1 MHz

Note:

1. Parameter values are not 100% tested. For more information on capacitance, please consult the IBIS models.

Unit

pF

ns

V

V

V

Max

Unit

8

pF

8

pF

Document Number: 001-98282 Rev. *I

Page 30 of 142

Share Link: