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S25FL256SDSBFIQ01 View Datasheet(PDF) - Cypress Semiconductor

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Description
Manufacturer
S25FL256SDSBFIQ01 Datasheet PDF : 144 Pages
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S25FL128S, S25FL256S
5. Timing Specifications
5.1
Key to Switching Waveforms
Figure 5.1 Waveform Element Meanings
Input Valid at logic high or low High Impedance Any change permitted Logic high Logic low
Symbol
Output Valid at logic high or low High Impedance Changing, state unknown Logic high Logic low
Figure 5.2 Input, Output, and Timing Reference Levels
Input Levels
VIO + 0.4V
0.7 x VIO
Output Levels
0.85 x VIO
0.5 x VIO
Timing Reference Level
0.2 x VIO
- 0.5V
0.15 x VIO
5.2 AC Test Conditions
Figure 5.3 Test Setup
Device
Under
Test
CL
Table 5.1 AC Measurement Conditions
Symbol
Parameter
Min
Max
Unit
CL
Load Capacitance
30
pF
15 (4)
Input Rise and Fall Times
2.4
ns
Input Pulse Voltage
0.2 x VIO to 0.8 VIO
V
Input Timing Ref Voltage
0.5 VIO
V
Output Timing Ref Voltage
0.5 VIO
V
Notes:
1. Output High-Z is defined as the point where data is no longer driven.
2. Input slew rate: 1.5 V/ns.
3. AC characteristics tables assume clock and data signals have the same slew rate (slope).
4. DDR Operation.
Document Number: 001-98283 Rev. *I
Page 29 of 144

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