DSP16410C View Datasheet(PDF) - Agere -> LSI Corporation

Part Name

Description

Manufacturer

DSP16410C

Digital Signal Processor

Agere -> LSI Corporation 

Data Addendum

May 2001

DSP16410C Digital Signal Processor

5 Ball Grid Array Information (continued)

5.2 256-Ball EBGA Package (continued)

Table 3. 256-Ball EBGA Ball Assignments Sorted Alphabetically by Symbol (continued)

Symbol

VSS

VSS1A

NC

PBGA Coordinate

A1, A5, A6, A12, A13, A16, A20, B2, B19, C3,

C18, E1, E20, F20, H1, J1, M20, N20, R1, T1,

T20, V3, V17, V18, W2, W19, Y1, Y5, Y8, Y9,

Y15, Y16, Y20

J20

B7, B15, C17, D4, D17, F2, G19, K3, P2,

R19, U4, U17, U18, V4, V19, V20, W6, W14

Type

G

G

—

Ground.

Description

Ground for PLL Circuitry.

Not Connected. Tie externally to ground.

6 Device Characteristics

6.1 Absolute Maximum Ratings

Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. These are abso-

lute stress ratings only. Functional operation of the device is not implied at these or any other conditions in excess

of those given in the operational sections of the data sheet. Exposure to absolute maximum ratings for extended

periods can adversely affect device reliability.

External leads can be bonded and soldered safely at temperatures of up to 220 °C.

Table 4. Absolute Maximum Ratings for Supply Pins

Parameter

Voltage on VDD1 with Respect to Ground

Voltage on VDD1A with Respect to Ground

Voltage on VDD2 with Respect to Ground

Voltage Range on Any Signal Pin

Junction Temperature (TJ)

Storage Temperature Range

Min

–0.5

–0.5

–0.5

VSS – 0.3

–40

–40

Max

Unit

1.8

V

1.8

V

4.0

V

VDD2 + 0.3

V

4.0

125

°C

150

°C

6.2 Handling Precautions

All MOS devices must be handled with certain precautions to avoid damage due to the accumulation of static

charge. Although input protection circuitry has been incorporated into the devices to minimize the effect of this

static buildup, proper precautions should be taken to avoid exposure to electrostatic discharge during handling and

mounting. Agere Systems Inc. employs a human-body model for ESD-susceptibility testing. Since the failure volt-

age of electronic devices is dependent on the current, voltage, and hence, the resistance and capacitance, it is

important that standard values be employed to establish a reference by which to compare test data. Values of

100 pF and 1500 Ω are the most common and are the values used in the Agere human-body model test circuit.

The breakdown voltage for the DSP16410C is greater than 1000 V.

Agere Systems Inc.

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